Mr. Ali Pourkazemi

Biography

Master of Science in Wave Telecommunications, 2008, K.N. Toosi University of Technology, Tehran, Iran PhD in Engineering Sciences, Vrije Universiteit Brussel, 2017

Research Interest

Characterization of materials at various electromagnetic wave frequencies (microwave, millimeter, terahertz,…) is very important for a wide range of applications. Many researchers have proposed several methods to calculate the electromagnetic response of a multilayer structure comprising materials with various electromagnetic properties and thicknesses. However it is a challenge to devise a good illumination strategy at reasonable cost and to develop a numerical procedure to extract these properties by means of a method and device operating in the considered electromagnetic spectrum. This research is targeting any field where one needs to measure layer thicknesses and electromagnetic characteristics of multilayer structures. A new solution at reasonable cost is targeted in multi-sectorial application domains: non-destructive testing industry, piping industry, wind energy industry, biotechnology, food industry, pharmacy,… The research project is aiming at detecting and determining dielectric and/or magnetic characteristics of multilayer structures as shown in Fig(a). The project research targets to benchmark various traditional methods and algorithms and our new algorithms under development