Dr. Johnson Li

Biography

Education: Ph.D. (University of Alberta) M.Phil. (Chinese University of Hong Kong) B.SSc. (University of Hong Kong)

Research Interest

Scale development/item analysis: I am particularly interested in improving reliability estimation in developing scales and tests in psychology. For example, we should use modern reliability coefficients (e.g., scale reliability) when the assumption for the conventional alpha (e.g., uni-dimensionality) is violated. I am also interested in collaborating with scale developers and researchers to validate scales (e.g., Spence Children's Anxiety Scale, Learning-related Boredom Scale, etc.). Nonparametric/robust statistics: Most of the conventional analytic techniques (e.g., t test, ANOVA, regression) depend upon data assumptions (e.g., normality, equal variances). I am interested in proposing and developing nonparametric/robust statistics when these assumptions are violated in practice.