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Sven Achenbach

Professor
Electrical and Computer Engineering
University of Saskatchewan
Canada

Biography

Sven Achenbach studied Mechanical Engineering at the University of Karlsruhe, Germany. Since 1996, he has worked at the national laboratory LURE in Paris and the German national laboratory Forschungszentrum Karlsruhe (FZK), optimizing microfabrication process technologies. He received his Ph.D. on ultra deep X-ray lithography in 2000. His research focuses on various aspects of X-ray lithography process technology and on selected applications areas (including RF MEMS and micro/nano fluidics). The research is carried out at various electron storage rings worldwide, in cooperation with several laboratories, universities and companies in Europe, America and Asia. From 2005-2016, Sven Achenbach assumed the Canada Research Chair in Micro and Nano Device Fabrication at the University of Saskatchewan, Saskatoon, Canada. He is a Professor of Electrical Engineering, Principal Investigator and Beam Team Leader at SyLMAND, Canada's first X-ray lithography laboratory, and an Adjunct Scientist of Telecommunication Research Labs of Canada (TRLabs) at Innovation Place, Saskatoon. The main focus of current activities is finishing capital construction and scientific commissioning of SyLMAND, the Synchrotron Laboratory for Micro and Nano Devices, at the Canadian Light Source (CLS). SyLMAND is a unique, multi million $ facility in Canada, comprising a dedicated synchrotron beamline and several wet chemical, metrology and preparation labs in a clean room environment. Recent applications of research projects include high performance active and passive RF MEMS devices, biomedical detectors and microdfluidic test patterns as well as optical components such as IR bandpass filters

Research Interest

His research focuses on various aspects of X-ray lithography process technology and on selected applications areas (including RF MEMS and micro/nano fluidics).

Publications

  • Haluzan DT, Klymyshyn DM, Achenbach S, Börner M, Mohr J. VM-TEST: Mechanical property measurement using electrostatically actuated vertical MEMS test structures fabricated in thick metal layers. Microsystem technologies. 2012 Apr 1;18(4):443-52.

  • Hashemi M, Moazed B, Achenbach S, Klymyshyn D. Functional analysis of single Poly (methyl-methacrylate)-based submicron pore electrophoretic flow detectors via translocation of differently sized silica nanoparticles. IET nanobiotechnology. 2012 Dec 1;6(4):149-55.

  • Achenbach S, Hashemi M, Moazed B, Klymyshyn D. Fabrication and electrical characterisation of an all-PMMA and PMMA/lipid bi-layer single submicron pore electrophoretic flow detector for biomedical applications. Microelectronic Engineering. 2012 Oct 31;98:630-3.

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