Chunlan Zhou
Professor
Institute of Electrical Engineering
Chinese Academy of Sciences
China
Biography
1996.9-2000.7 School of Physical Science and Technology, Lanzhou University; Bachelor Degree 2000.9-2005.7 Institute of High Energy Physics, CAS; Doctoral Degree The application of slow positron beam technology in defects characterization of material; the Photoluminescences of Silicon Nanocrystal in silicon oxide films; the preparation and characterization of SiO2 thin optical coatings. 2005.8-2006.7 The Institute of Low Energy Nuclear Physics, Beijing Normal University; Lecturer Development and Applications of Spectral Response Measurement Instrument for Photomultiplier Tube. 2006.7- Institute of Electrical Engineering, Chinese Academy of Sciences (IEECAS); Associate Professor The study of silicon-based material and photovoltaics devices
Research Interest
Silicon-based material and silicon-based photovoltaics 1: Crystal silicon photovoltaics 2: Defects, metastability, and diffusion in semiconductors 3: Hydrogenation for passivation of defective silicon 4: Material characterization
Publications
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3：Chunlan Zhou， Tianbao Zhang，Chuangxin Ma，Zhiming Zhang，Xingzhong Cao，Baoyi Wang，Long Wei，Analysis of 3γ/2γ ratio in the measurement of positron annihilation Doppler-Broadening spectroscopy，High energy physics and nuclear physics 30（2006）1 (In Chinese)
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2：Chunlan Zhou, Danni Wang, Changxing Ma, Baoyi Wang, and Long Wei, Positron beam studies of argon irradiated polycrystal α-Zr，J. Appl. Phys 97 (2005) 06531
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1：Chunlan Zhou，Danni Wang，Chuangxin Ma，Baoyi Wang，Long Wei，Qin He，Quanjie Jia，Study on pores and defect by synthrotron radiation small angle reflection method and slow positron annihilation technology，High energy physics and nuclear physics 27，61 (2003） (In Chinese)
