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Xiaowei Li


Institute of Computing Technology
Chinese Academy of Sciences
China

Biography

Xiaowei Li, was born in 1964. He received his B.Eng. and M.Eng. degrees in Computer Science from Hefei University of Technology, China, in 1985 and 1988, respectively, and his Ph.D. degree in Computer Science from the Institute of Computing Technology (ICT), Chinese Academy of Sciences (CAS), in 1991. From 1991 to 2000, he was an assistant professor and an associate professor (since 1993) in the Department of Computer Science, Peking University, China. He joined the ICT, CAS as a Professor in 2000. He is now the deputy (executive) director of the State Key Lab. of Computer Architecture (ICT, CAS). He is a senior member of IEEE. Dr. Li’s research interests include VLSI Testing, design verification, dependable computing. He has co-published over 200 papers in academic journals and international conference, hold 34 patents and 35 software copyrights. Dr. Li served as Chair of CCF (China Computer Federation) Technical Committee on Fault Tolerant Computing since 2008. He served as IEEE Asian Pacific Regional TTTC (Test Technology Technical Council) Vice Chair since 2004. He served as the Steering Committee Chair of IEEE Asian Test Symposium (ATS) since 2011. In addition, he serves on the Technical Program Committee of several IEEE and ACM conferences, including VTS, DATE, ASP-DAC, PRDC, etc. He also serves as member of editorial board of JCST, JETTA, JOLPE, etc.Xiaowei Li, was born in 1964. He received his B.Eng. and M.Eng. degrees in Computer Science from Hefei University of Technology, China, in 1985 and 1988, respectively, and his Ph.D. degree in Computer Science from the Institute of Computing Technology (ICT), Chinese Academy of Sciences (CAS), in 1991. From 1991 to 2000, he was an assistant professor and an associate professor (since 1993) in the Department of Computer Science, Peking University, China. He joined the ICT, CAS as a Professor in 2000. He is now the deputy (executive) director of the State Key Lab. of Computer Architecture (ICT, CAS). He is a senior member of IEEE. Dr. Li’s research interests include VLSI Testing, design verification, dependable computing. He has co-published over 200 papers in academic journals and international conference, hold 34 patents and 35 software copyrights. Dr. Li served as Chair of CCF (China Computer Federation) Technical Committee on Fault Tolerant Computing since 2008. He served as IEEE Asian Pacific Regional TTTC (Test Technology Technical Council) Vice Chair since 2004. He served as the Steering Committee Chair of IEEE Asian Test Symposium (ATS) since 2011. In addition, he serves on the Technical Program Committee of several IEEE and ACM conferences, including VTS, DATE, ASP-DAC, PRDC, etc. He also serves as member of editorial board of JCST, JETTA, JOLPE, etc.

Research Interest

Computer Application Technology (Multimedia Analysis, Computer Vision, Data Mining)

Publications

  • Xiang Fu, Huawei Li, Xiaowei Li, “Testable Path Selection and Grouping for Faster Than At-Speed Testing”, IEEE Transactions on VLSI Systems, Vol.11, No.02, February 2012, pp.236-247

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