Xin Lou
Assistant Professor, PI
Information Science and Technology
Shanghai Tech University
China
Biography
Dr. Lou obtained his bachelor’s degree in Electronic Science and Technology from Zhejiang University (ZJU), China, in 2010 and Master’s degree in System-on-Chip Design from Royal Institute of Technology (KTH), Sweden, in 2012 and PhD degree in Electrical and Electronic Engineering from Nanyang Technological University (NTU), Singapore, in 2016. Then he joined VIRTUS, IC Design Centre of Excellence in the same university as a research scientist. In Feb. 2017, Dr. Lou joined School of Information Science and Technology, ShanghaiTech University as an assistant professor, PI.
Research Interest
Digital FIR filter design and implementation, Energy-efficient VLSI digital signal processing circuits and systems, VLSI cryptographic circuits and systems
Publications
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X. Lou*, Y. J. Yu and P. K. Meher, “Lower Bound Analysis and Perturbation of Critical Path for Area-Time Efficient Multiple Constant Multiplicationsâ€, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol 36, no. 2, pp. 313-324, Feb. 2017.
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X. Lou*, Y. J. Yu and P. K. Meher, “Lower Bound Analysis and Perturbation of Critical Path for Area-Time Efficient Multiple Constant Multiplicationsâ€, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol 36, no. 2, pp. 313-324, Feb. 2017.
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X. Lou*, Y. J. Yu and P. K. Meher, “Analysis and Optimization of Product-Accumulation Section for Efficient Implementation of FIR Filtersâ€, IEEE Transactions on Circuits and Systems I, vol 63, no. 10, pp. 1701-1713, Oct. 2016.
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X. Lou*, Y. J. Yu and P. K. Meher, “New Approach to the Reduction of Sign-extension Overhead for Efficient Implementation of Multiple Constant Multiplicationsâ€, IEEE Transactions on Circuits and Systems I, vol 62, no. 11, pp. 2695-2705, Nov. 2015.
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X. Lou*, Y. J. Yu and P. K. Meher, “Fine-Grained Critical Path Analysis and Optimization for Area-Time Efficient Realization of Multiple Constant Multiplicationsâ€, IEEE Transactions on Circuits and Systems I, vol 62, no. 3, pp. 863-872, Mar. 2015.
