Andreas Thust
Scientist
Scientific Staff, Section Leader Electron Optics and (S)TEM
Ernst Ruska-Centre
Germany
Biography
Dr Andreas Thust serves as Scientific Staff, Section Leader Electron Optics and (S)TEM Method Development at Ernst Ruska-Centre (ER-C) and Peter Grünberg Institute (PGI-5). He has expertise in Extraction of quantitative information from high-resolution electron microscopy images with a special emphasis on exit wave function reconstruction methods.
Research Interest
Extraction of quantitative information from high-resolution electron microscopy images with a special emphasis on exit wave function reconstruction methods.
Publications
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Thust, A., Barthel, J., & Tillmann, K. (2016). FEI Titan 80-300 TEM. Journal of large-scale research facilities JLSRF, 2, 41.
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Tillmann, K., Houben, L., & Thust, A. (2006). Atomic-resolution imaging of lattice imperfections in semiconductors by combined aberration-corrected HRTEM and exit-plane wavefunction retrieval. Philosophical magazine, 86(29-31), 4589-4606.
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Tillmann, K., Houben, L., Thust, A., & Urban, K. (2006). Spherical-aberration correction in tandem with the restoration of the exit-plane wavefunction: synergetic tools for the imaging of lattice imperfections in crystalline solids at atomic resolution. Journal of materials science, 41(14), 4420-4433.
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Jia, C. L., Barthel, J., Gunkel, F., Dittmann, R., Hoffmann-Eifert, S., Houben, L., ... & Thust, A. (2013). Atomic-scale measurement of structure and chemistry of a single-unit-cell layer of LaAlO3 embedded in SrTiO3. Microscopy and Microanalysis, 19(2), 310-318.
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O keefe, M. A., Nelson, E. C., Wang, Y. C., & Thust, A. (2001). Sub-ångström resolution of atomistic structures below 0.8 Å. Philosophical Magazine B, 81(11), 1861-1878.
