Emiliano Bonera
Associate professor
Materials Science
University of Milano-Bicocca
Italy
Biography
Emiliano Bonera graduated in Physics at the University of Pavia in 1998 after being also an exchange student at the University of Strathclyde in Glasgow. The topic of his dissertation was near-field microscopy. He obtained his PhD in Physics in 2002 from the University of Leeds with a thesis about micro and near-field optical characterisation of microelectronic materials. After two years working as a post-doctoral fellow at the Material and Devices for Microelectronics Laboratory, a government lab within the industrial site of STMicroelectronics, he became there in 2004 a research associate. His mission in MDM was to setup and follow optical characterisation facilities. From 2007 he joined the University of Milan Bicocca as a researcher. His interests spanned mainly on Raman and photoluminescence spectroscopy, internal photoemission spectroscopy, infrared spectroscopy, and near-field optical microscopy. He applied these techniques to the study of semiconductors, insulators, nanoclusters, high-k materials, and other microelectronic-related issues.
Research Interest
Optical spectroscopy of semiconductors and semiconductor nanostructures.
Publications
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Lithographically defined low dimensional SiGe nanostripes as silicon stressors M. Bollani, D. Chrastina, M. Fiocco, V. Mondiali, J. Frigerio, L. Gagliano and E. Bonera J. Appl. Phys. 112, 094318 (2012) .
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Substrate strain manipulation by nanostructure perimeter forces E. Bonera, M. Bollani, D. Chrastina, F. Pezzoli, A. Picco, O. G. Schmidt and D. Terziotti J. Appl. Phys. 113, 164308 (2013).
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Dislocation distribution across ultrathin silicon-on-insulator with epitaxial SiGe stressor Emiliano Bonera, Riccardo Gatti, Giovanni Isella, Gerd Norga, Andrea Picco, Emanuele Grilli, Mario Guzzi, Michaël Texier, Bernard Pichaud, Hans von Känel and Leo Miglio Appl. Phys. Lett. 103, 053104 (2013).
