Dr. Albert Theuwissen
Parttime Professor
Department of Microelectronics
Delft University of Technology
Netherlands
Biography
"Albert J.P. Theuwissen was born in Maaseik (Belgium) on December 20, 1954. He received the degree in electrical engineering from the Catholic University of Leuven (Belgium) in 1977. His thesis work was based on the development of supporting hardware around a linear CCD image sensor. From 1977 to 1983, his work at the ESAT laboratory of the Catholic University of Leuven focused on semiconductor technology for linear CCD image sensors. He received the Ph.D. degree in electrical engineering in 1983. His dissertation was on the implementation of transparent conductive layers as gate material in the CCD technology. "
Research Interest
Imaging sensors
Publications
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A Two Conversions/Sample Differential Slope Multiple Sampling ADC With Accelerated Counter Architecture
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A comparative noise analysis and measurement for n-type and p-type pixels with CMS technique
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A CMOS image sensor with nearly unity-gain source follower and optimized column amplifier
