Ong Keng Sian, Vincent
Senior Lecturer
School of Electrical & Electronic Engineering
Nanyang Technological University
Singapore
Biography
Vincent K.S. ONG received the Bachelor of Engineering degree (with Honors) in Electrical Engineering, the Master of Engineering, and Doctor of Philosophy degrees in Electronics in 1981, 1989, and 1996 respectively. He worked as an Engineer at the Hewlett Packard Company, both in Singapore and the United States, from 1981 to 1984. Between 1984 and 1992, he was Engineering Manager in the same company. He joined the Faculty of Engineering of the National University of Singapore in 1992 to pursue his first love – research. At the NUS, he managed a Research Centre, and worked on research relating to the electron beam effects on Integrated Circuits. In 1997, he joined the Nanyang Technological University, Singapore, as Senior Lecturer in the School of Electrical and Electronic Engineering. In 1999, he became Associate Professor. He was Visiting Fellow at the University of Cambridge in 2005.
Research Interest
Area of Electron Beam Induced Current Metrology and the Single Contact Electron Beam Induced Current Techniques.
Publications
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V.K.S. Ong, O. Kurniawan, G. Moldovan, and C.J. Humphreys. (2006). A method of accurately determining the positions of the edges of depletion regions in semiconductor junctions. Journal of Applied Physics, 100(11), 114501.
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G. Moldovan, P. Kazemian, P. Edwards, V.K.S. Ong, O. Kurniawan, and C.J. Humphreys. (2007). Low-Voltage Cross-Sectional EBIC for Characterisation of GaN-Based Light Emitting Devices. Ultramicroscopy, 107(4-5), 382-389.
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O. Kurniawan and V.K.S. Ong. (2008). Charge Collection from Within a Collecting Junction Well. IEEE Transactions on Electron Devices, 55(5), 1220-1228.
