Abdelghani Renbi

Biography

The purpose of electronic systems testing is to ensure that the manufactured product is error-free. Due to the evolution of VLSI chips and the complexity of embedded systems, today’s testing is costly and time consuming. On the other hand it is worthwhile to spend time and extra cost to ensure an error-free product, as the cost of not detecting a fault could be disastrous or more expensive causing human, economical or environmental losses. We cannot imagine a chip, which is targeted for safety critical applications such as avionics to get into the hand of user without being tested. My research goal is to develop methods and tools to standardize testing and verification at the production stage. The aim is also to link back the testing and verification processes to the design stage and drive the issue of Design for Testability (DFT). If this process can be standardized and entered as a parameter early in the design chain, there will be a potential for big savings. By developing an Automatic Test Equipment (ATE), which is general, and whose performance and interface are known already at the design stage, this equipment can be used as a parameter in the design phase. The research aims also to develop standards for requirements testing and link back the impact this may have on the process.

Research Interest

Industrial Electronics