Mark A Lantz

Biography

Mark Lantz received B.Sc. (91) and M.Sc. (93) degrees in electrical engineering from the University of Alberta, Canada, and a Ph.D. from the University of Cambridge, U.K., in 1997 for work in the field of scanning probe microscopy and tribology. He then spent two years as a postdoctoral researcher at the Joint Research Center for Atom Technology in Japan, investigating the application of scanning probes in biophysics, followed by two years of research in the area of low temperature scanning force microscopy at the Physics Institute in the University of Basel, Switzerland. Mark Lantz received B.Sc. (91) and M.Sc. (93) degrees in electrical engineering from the University of Alberta, Canada, and a Ph.D. from the University of Cambridge, U.K., in 1997 for work in the field of scanning probe microscopy and tribology. He then spent two years as a postdoctoral researcher at the Joint Research Center for Atom Technology in Japan, investigating the application of scanning probes in biophysics, followed by two years of research in the area of low temperature scanning force microscopy at the Physics Institute in the University of Basel, Switzerland.

Research Interest

Electrical engineering