Meng Duan
Research Associate
Department of Engineering
University of Glasgow
United Kingdom
Biography
Meng Duan is currently working as a Research Associate in the Department of Engineering
Research Interest
Electronic and Nanoscale Engineering
Publications
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Duan, M. , Zhang, J. F., Ji, Z., Zhang, W. D., Vigar, D., Asenov, A., Gerrer, L., Chandra, V., Aitken, R. and Kaczer, B. (2016) Insight into electron traps and their energy distribution under positive bias temperature stress and hot carrier aging. IEEE Transactions on Electron Devices, 63(9), pp. 3642-3648.
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Duan, M. , Zhang, J. F., Ji, Z., Zhang, W. D., Kaczer, B. and Asenov, A. (2017) Key issues and solutions for characterizing hot carrier aging of nanometer scale nMOSFETs. IEEE Transactions on Electron Devices, 64(6), pp. 2478-2484.
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Navarro, C. et al. (2017) Extended analysis of the Z²-FET: operation as capacitorless eDRAM. IEEE Transactions on Electron Devices, 64(11), pp. 4486-4491.
