Albert Macrander
Researcher
Department of Physics
Argonne National Laboratory
United States of America
Biography
As group leader of the Optics Fabrication and Metrology group of the X-ray Science Division, Albert T. Macrander guides optics work for beamlines at Argonne’s synchrotron, the Advanced Photon Source at Argonne. Recently these include development of lenses that focus hard X-rays to 16 nanometers. Macrander obtained his Ph.D in physics at the University of Illinois at Urbana-Champaign. He was a Postdoctoral Associate at Cornell University in materials science. Prior to starting work at Argonne, he was a member of the technical staff at Bell Laboratories in Murray Hill, NJ. He has published over 100 peer reviewed papers and co-authored a book that covered his work at Bell Labs. He has co-edited eight conference proceedings and has been awarded three patents. Macrander is also the head editor for Review of Scientific Instruments, a fully peer reviewed journal published by the American Institute of Physics (AIP). He is presently chair of the AIP Editor’s panel.
Research Interest
Optics Fabrication, Metrology group of the X-ray Science Division, Physics
Publications
-
Yan H, Rose V, Shu D, Lima E, Kang HC, Conley R, Liu C, Jahedi N, Macrander AT, Stephenson GB, Holt M. Two dimensional hard x-ray nanofocusing with crossed multilayer Laue lenses. Optics Express. 2011 Aug 1;19(16):15069-76.
-
Liu W, Ice GE, Tischler JZ, Khounsary A, Liu C, Assoufid L, Macrander AT. Short focal length Kirkpatrick-Baez mirrors for a hard x-ray nanoprobe. Review of scientific instruments. 2005 Nov;76(11):113701.
-
Kang HC, Yan H, Winarski RP, Holt MV, Maser J, Liu C, Conley R, Vogt S, Macrander AT, Stephenson GB. Focusing of hard x-rays to 16 nanometers with a multilayer Laue lens. Applied Physics Letters. 2008 Jun 2;92(22):221114.
