Wayne D. Niemeyer

Biography

Wayne joined the electron optics group at McCrone Associates, Inc. in 1992 as a senior research scientist. He currently specializes in X-ray microanalysis of particles using energy and wavelength dispersive spectrometry methods with the scanning electron microscope and electron microprobe. As part of his forensic work, Wayne conducts gunshot residue analysis using the scanning electron microscope and has testified in many trials. He currently serves on the international Scientific Working Group for Gunshot Residue and was recently selected to serve on the federal government’s Organization of Scientific Area Committees (OSAC) – Gunshot Residue Subcommittee. As an instructor for Hooke College of Applied Sciences, Wayne is a co-instructor for the Scanning Electron Microscopy course and the lead instructor for the Gunshot Residue Identification course.

Research Interest

  Wayne has extensive and diverse analytical capabilities developed during a long career in a research and development environment. These include, among others, optical microscopy (polarized light and fluorescence), scanning electron microscopy, X-ray spectrometry, secondary ion mass spectrometry, infrared spectroscopy, X-Ray photoelectron spectroscopy. He began acquiring his experience working for the National Can Corporation Research and Development Laboratory in Chicago, IL where his developmental responsibilities included metal surface treatments, lubrication processes for drawn and ironed can making, electrochemical methods to determine shelf life of food and beverage containers, and industrial waste water treatment processes. He was often called in to investigate production plant process chemistry problems as needed.